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Investigation
Other
Methods

Methods exploited in our group:

  • Near-field Scanning Optical Microscopy
  • Atomic Force Microscopy
  • static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
  • X ray Photoelectron Spectroscopy (XPS)
  • Fluorescence Microscope
  • White Light Reflectance Spectroscopy (WLRS)
  • Drop Shape Analysis System
  • Film Deposition and Soft Lithography
  • Environmental Chamber

 

Near-field Scanning Optical Microscopy

 

Atomic Force Microscopy

   

static and dynamic Secondary Ion Mass Spectroscopy (SIMS)
X ray Photoelectron Spectroscopy (XPS)

   

 

 

new TOF-SIMS system

   

Fluorescence Microscope


White Light Reflectance Spectroscopy (WLRS)


Drop Shape Analysis System

 

Film Deposition / Soft Lithography

 

Environmental Chamber

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